▲Device Description

Device Name: Chip Dynamic Aging Test System

Device Model: FLT-3101

Manufacturer: Shanghai Philai Testing Technology Co., Ltd.

Supports real-time graphical display of product operation status and test data

Supports the formulation of multi-step test plans according to different test conditions, and one-click operation

Supports multi-level permissions and function control for operators, engineers, engineering debugging, and system management

Supports MES, SECS/GEM access and function customization

Supports central server management and download of test programs

Supports hierarchical execution of continue, pause, stop and other strategies according to abnormal scenarios

Supports data recovery and test recovery in scenarios such as factory power failure, emergency stop, abnormal software shutdown, etc.

Supports abnormal information summary and query

Supports constant temperature hot air circulation in the test chamber and water circulation heat dissipation outside the chamber

Supports independent temperature control of a single socket

Supports power-on timing configuration and step-by-step power-on

Supports configurable overvoltage, undervoltage, overcurrent and other protection strategies

Supports test vector loading, output and error detection

Supports test vector data readback, analysis and report generation

Supports judging chip connectivity based on power supply and test vectors before aging

Supports timed local and central server storage and backup of test data and log information