▲Device description

Device name: Chip dynamic aging test system

Device model: FLT-3201

Manufacturer: Shanghai Philai Testing Technology Co., Ltd.

▲Key features

· Support constant temperature hot air circulation in the test chamber and water circulation heat dissipation outside the chamber

· Support independent temperature control of a single socket

· Support power-on timing configuration and step-by-step power-on

· Support configurable overvoltage, undervoltage, overcurrent and other protection strategies

· Support test vector loading, output and error detection

· Support test vector data readback, analysis and report generation

· Support chip connectivity based on power supply and test vector before aging

· Support test data and log information timed local and central server storage and backup

· Support real-time graphical display of product operation status and test data

· Support the formulation of multi-step test plans according to different test conditions, and run with one click

· Support multi-level permissions and functions for operators, engineers, engineering debugging, and system management

· Function control

· Support MES, SECS/GEM access and function customization

· Support test program central server control and download

· Support hierarchical execution of continue, pause, stop and other strategies according to abnormal scenarios

· Support data recovery and test in scenarios such as factory power outage, emergency stop, abnormal software shutdown, etc.

· Test recovery

· Support abnormal information summary and query