▲Device Description

Device Name: Chip Dynamic Aging Test System

Device Model: FLT-3101

Manufacturer: Shanghai Philai Testing Technology Co., Ltd.

 Supports real-time graphical display of product operation status and test data

 Supports the formulation of multi-step test plans according to different test conditions, and one-click operation

Key Features

· Supports constant temperature hot air circulation in the test chamber and water circulation heat dissipation outside the chamber

· Supports power-on timing configuration and step power-on

· Supports configurable overvoltage, undervoltage, overcurrent and other protection strategies

· Supports test vector loading, output and error detection

· Supports test vector data readback, analysis and report generation

· Supports judging chip connectivity based on power supply and test vector before aging

· Supports timed local and central server storage and backup of test data and log information

· Supports real-time graphical display of product operation status and test data

· Supports the formulation of multi-step test plans according to different test conditions, and one-click operation

· Supports multi-level permissions and function control for operators, engineers, engineering debugging, and system management

· Supports MES, SECS/GEM access and function customization

· Supports central server control and download of test programs

· Supports hierarchical execution of continue, pause, stop and other strategies based on abnormal scenarios

· Supports data recovery and test recovery in scenarios such as factory power outages, emergency stops, and abnormal software shutdowns

· Supports abnormal information aggregation and query