▲Device description

Device name: Chip dynamic aging test system

Device model: FLT-3301

Manufacturer: Shanghai Philai Testing Technology Co., Ltd.

▲Key features

· Supports constant temperature hot air circulation in the test chamber and water circulation heat dissipation outside the chamber

· Supports independent temperature control of a single socket

· Supports power-on timing configuration and step-by-step power-on

· Supports configurable overvoltage, undervoltage, overcurrent and other protection strategies

· Supports test vector loading, output and error detection

· Supports test vector data readback, analysis and report generation

· Supports judging the connectivity of the chip based on the power supply and test vector before aging

· Supports timed local and central server storage and backup of test data and log information

· Supports real-time graphical display of product operation status and test data

· Supports the formulation of multi-step test plans based on different test conditions and one-click operation

· Supports multi-level permissions and function control for operators, engineers, engineering debugging, and system management

· Support MES, SECS/GEM access and function customization

· Support test program central server control and download

· Support hierarchical execution of continue, pause, stop and other strategies according to abnormal scenarios

· Support data recovery and test recovery in scenarios such as factory power outage, emergency stop, abnormal software shutdown, etc.

· Support abnormal information summary and query