FeedLiTechhas successfully developed a reliability solution test equipment for NAND chips and D-RAM chips in the storage field. These devices are designed to ensure that the chip can operate stably in a complex and variety storage environment. Through strict testing processes, it effectively improves the reliability of the chip. The NAND chip is known for its high storage density and rapid reading and writing speed, while the D-RAM chip occupies an important position in data processing with its high-speed access capacity. The testing equipment of Phille Technology provides solid quality guarantee for these two key chips, and further promotes the development and application of storage technology.