Product Features
>This device is a consumer-grade VCSEL Array wafer-level
 comprehensive testing system.
>It supports CW or QCW testing, with a minimum pulse width of 10us and a current of 0-10A.
>It supports LIV+spectral testing, FF testing, NF testing( including M2 and divergence angle testing)
>Modular design, three testing modules can be freely matched with different testing modules for easy integration and maintenance.
>Fully self-developed testing software, calculation parameters can be customized according to Customer needs.
>It supports breakpoint continuation testing, bad point retesting and alarm for the same continuous failure mode.
>It supports the statistics of informations such as testing time, quantity, time, utilization rate, probe usage frequency etc.
>It supports the functions such as mapping selection, circle reduction, sampling, designated area testing etc.
>The water-cooled and TEC technology is used to control temperature, the temperature can be controlled within a wide range, and it has extremely high stability and accuracy.
>It supports the integration of Customer MES systems so as to ensure the data security and traceability.
>The excellent ESD and EOS prevention measures can ensure the product safety during the product retesting process.